labs group the following facilities:
High Resolution Field Emission Scanning
Electron Microscopy (UHR-FE-SEM) and Focused
Ion Beam (FIB), model CrossBeam®
1540XB by Zeiss; Download sample
SEM Resolution 1.1nm, FIB Resolution 7nm.
Force Microscope Explorer by Thermomicroscopes - Veeco.
(Explorer head, 100um tripod & 2um tube
scanners, ECU+ control unit).
Scanning-probe AFM suitable for morphological, mechanical and tribological
characterization of samples down to the nanometer scale. It operates
in a glove-box chamber under controlled atmosphere and humidity or
in liquid environment.
Operating modes: C-AFM, LFM-AFM, NC-AFM, Phase Imaging, Force
Force Microscope Dimension 3100 by Digital Instruments - Veeco.
3100 platform, XYZ Hybrid Head, Nanoscope IVa control unit).
AFM for single molecule characterization and manipulation. It is placed
in a glove-box chamber for controlled atmosphere and humidity; it
operates also in liquid environment.
Operating modes: C-AFM, LFM-AFM, NC-AFM.
Transform Infrared Spectrometer
(FTIR-THERMO) for optical
characterization of samples in the infrared spectral range